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- www.nxp.com
  
  Automotive - Home :: NXP Semiconductors
  
  Introduction The operating environment of automobile semiconductor components is much more hostile than that of semiconductors used in home or portable applications. A television set will generally spend its operating lifetime within an ambient temperatur
  
  2024-07-19
  
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- www.istgroup.com
  
  宜特科技-分析、檢測與可靠度 - 【技術文章分享】進入車電市場，車電供應鏈廠家先搞懂AEC與ISO/TS 16949
  
  發布單位: iST 發布日期: 2014/3/10 汽車領域今年初最大亮點是Google在2014 CES中展出了未來車用的Android平台，INTEL / nVIDIA等大廠也產出相關車用電子產品，應用平臺的建立將會加速相關車用電子產品的開發，可預期的是車用電子市場將於今年爆炸性成長。
  
  2024-07-15
  
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aec q100的相關文章

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Avago ACPL-782T automotive isolataion amplifier ( AEC-Q100 ). Avago Technologies is a leading suppli

日期：2024-07-14

The ACPL-782T automotive isolation amplifier family was designed for current sensing in electronic motor drives and battery system. ... Qualified to AEC-Q100 Test Guidelines Automotive Operating Temperature -40 to 125 C 15 kV/μs Common-Mode Rejection at V...

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AEC Documents - Automotive Electronics Council

日期：2024-07-19

NOTE (dated August 20, 2013): The AEC - Q100-005 document was revised to correct errors that occurred during the publication process. The Rev-D1 ......

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Q100 Rev G - Automotive Electronics Council

日期：2024-07-21

2007年5月14日 - Automotive Electronics Council. TABLE OF CONTENTS. AEC-Q100 Failure Mechanism Based Stress Test Qualification for Integrated Circuits....

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AEC History - Automotive Electronics Council

日期：2024-07-20

The initial release of CDF-AEC Q100 (now shortened to AEC Q100) was ... AEC Founders from L-R Earl Fischer (Ford), Gerald Servais (Delco Electronics - GM)....

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Linear Technology/AEC-Q100 Qualification Testing

日期：2024-07-18

2. AEC- Q100 Test Requirements. AEC Q100 i. t f li bilit t. t t d fi d b th A t ti El t i C il f th. AEC-Q100 is a set of reliability stress tests defined by the Automotive ......

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Automotive Electronics Council - Wikipedia, the free ...

日期：2024-07-20

The Automotive Electronics Council (AEC) is an organisation based in the USA that ... AEC Q100 "Stress Test Qualification for Integrated Circuits" (1994); AEC ......

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