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      • www3.physik.uni-greifswald.de
        AFM (Atomic Force Microscope) Principles The Atomic Force Microscope (AFM) is one type of scanning probe microscopes, which is used to image surface structures (on a nm or even sub-nm scale scale) and to measure surface forces. The standard AFM ...
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    日期:2024-10-13
    AFM (Atomic Force Microscope) Principles The Atomic Force Microscope (AFM) is one type of scanning probe microscopes, which is used to image surface structures (on a nm or even sub-nm scale scale) and to measure surface forces. The standard AFM ......