search:icos t120相關網頁資料

- www.kla-tencor.com
  
  Back-End Defect Inspection - Component Defect Inspector and Wafer Defect Inspector | KLA-Tencor
  
  KLA-Tencor, through its ICOS division, offers a series of standalone defect inspection systems for ...
  
  2024-09-27
  
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- www.tracemode.com
  
  OPC, Modbus, DCS, PLC, Ethernet - SCADA HMI TRACE MODE
  
  I/O Connectivity PLC, I/O Cards and Protocols Supported by TRACE MODE 6 SCADA/HMI All TRACE MODE I/O drivers are provided free-of-charge. Drivers are built in the Integrated Development Environment or may be downloaded free from the SUPPORT section. ...
  
  2024-09-26
  
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icos t120的相關文章

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ICOS Vision Systems Introduces CI-T120 on Semicon Taiwan ...

日期：2024-09-29

7 Sep 2005 ... 7, 2005--ICOS Vision Systems Corporation NV (NASDAQ and Euronext: IVIS), a leading supplier of inspection solutions for the....

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ICOS Vision Systems Introduces CI-T120 on Semicon Taiwan. - Free ...

日期：2024-09-25

HEVERLEE, Belgium -- ICOS Vision Systems Corporation NV (NASDAQ and Euronext: IVIS), a leading supplier of inspection solutions for the semiconductor ......

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ICOS CI-T120/ CI-T130 Component Inspectors - Back-End Defect Inspection | KLA-Tencor

日期：2024-09-30

KLA-Tencor's CI-T120 and -T130 Component Inspectors are configured for high-volume inspection of Gull Wing, BGA, CSP and QFN devices, as well as memory cards. ... The CI-T120 and -T130 Component Inspectors are configured for high-volume inspection of ......

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Jipal Corporation

日期：2024-09-29

1 ) Hitachi High-Tech / Japan CM700 LOC & Window BGA Bonder. DB830 Series Flexible Die Bonder. 2 )...

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PANTHER TECHNOLOGY CO. ,LTD. - 鴻谷科技

日期：2024-10-02

Tester : 86 sets Credence SC Series ---- 41 sets Credence ASL1000 ---- 4 set Credence DUO ---- 5 sets LTX Fusion ---- 2 sets ... Fully Automatic Lead Scan & Tape - Reel Machine: ICOS CT-T120 ----- 2 SET ICOS 8250 ----- 1 SET ICOS 9450 ----- 1 SET TFS ......

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KLA-Tencor Corporation Semiconductor Metrology Instruments Data Sheets

日期：2024-09-28

The WaferSight 2's proprietary dual-sided interferometer measures wafer geometry parameters such as thickness, shape and flatness. The wafer geometry data from WaferSight 2 dual-sided interferometer, acquired in 3D, is capable......

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Capabilities | ASE Singapore Pte Ltd

日期：2024-09-25

Tri –Temp Testing (-50 C to 150 C) Multi Site Testing : Up to 16 sites Major package type FCBGA, HSBGA, PoP, aQFN, QFN & TQFP Package size (mm) 3×3 ~ 52.5×52.5 In-house Hardware Repair Labs, Hardware control automation In-Line Yield Monitoring via ......

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