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日期:2024-07-10
密度、高精度的垂直式探針卡(Vertical Probe Card),使得高單價的精密探針卡藉由 製程的改. 變因而降低其價格。 一、前言....
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日期:2024-07-08
微垂直探針卡之設計與製作. The design and fabrication of MEMS vertical probe card. 指導教授:鄒慶福. 學. 生:陳俊宇....
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日期:2024-07-07
Vertical probe for solder bump devices, contact with area array pads layout. Multi- Layer-Organic space transformer....
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日期:2024-07-09
Memory IC Vertical Probe Card STAr's Aries-Zenith MIP is a new vertical probe card technology for testing memory ICs. Aries-Zenith MIP enables high parallelism memory IC tests at pitch down to 70um and also wafer-level burn-in tests from -40 degC to 200 ....
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日期:2024-07-10
Probe Card Cantilever Type | Vertical Type Probe Head Probe Head can be ordered individually and compatible with your existing space transformer. MLO\MLC Type VPC Vertical probe for solder bump devices, contact with area array pads layout. Multi-Layer...
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日期:2024-07-05
A probe of a vertical probe card is disclosed. The probe has a probe tip and a surface region extended from the probe tip about 1-10 mil. The surface region is coated with a nano-film of high electro-conductive nano-material, and the thickness of the nano...
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日期:2024-07-11
JEM America offers a line of Vertical Probe Cards suitable for a wide spectrum of probing applications. The biggest focus in our R&D efforts is in the area of vertical contact technology. Combining breakthroughs in ......