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日期:2024-07-15
---I am about to sign my name, you observe, at the foot of the articles which Mr Chuckster will witness; and placing my finger upon this blue wafer with the vandyked corners, I am constrained to remark in a distinct tone of voice--don't be alarmed, ma'am,...
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日期:2024-07-13
Wafer Prober Wafer probers are machines used to test integrated circuits by aligning a set of microscopic contacts or pads with needle like probes in a probe card, The card is held in place while the wafer, vacuum-mounted on a wafer chuck, is moved into e...
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日期:2024-07-17
Non-destructive in-line wafer measurement of voiding and fill levels, overlay, critical dimensions and much more Industry standard handling of wafers - up to 300 mm Non-standard substrate handling versions available X-ray Technology Nordson DAGE, the lead...
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日期:2024-07-13
1 1 VLSI Testing Mohammad Tehranipoor Electrical and Computer Engineering University of Connecticut VLSI Design Verification and Testing 2 Objective Need to understand Types of tests performed at different stages Verification Testing Manufacturing Testing...
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日期:2024-07-16
Nordson DAGE, a division of Nordson Corporation (NASDAQ: NDSN), is pleased to announce the launch of its XM8000 Wafer X-ray Metrology Platform at the SEMI European 3D TSV Summit taking place in Grenoble, France 20th – 22nd January 2014. This new ......
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日期:2024-07-16
Parameter Min Typ Max Units Current source compliance voltage at a test current of 500 mA-45 Volts Current source minimum current 250 nA Current source maximum current 500 mA Voltage Detector Impedance 10 12 OHMS V/I Range for GEOM ......
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日期:2024-07-17
4 Design Verification & Testing Test Process Overview CMPE 418 Types of Testing Characterization testing Focus on tests that pass/fail chips Focus on worst case corners -- shmoo plots are created Helps in setting specification limits for production testin...