Device-level characterization of the flow of light in integrated photonic circuits using ultrafast p

Device-level characterization of the flow of light in integrated photonic circuits using ultrafast p

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日期:2025-03-31
Advances in silicon photonics have resulted in rapidly increasing complexity in integrated circuits. New methods that allow the direct characterization of individual optical components in situ, without the need for additional fabrication steps or test str...看更多