atomic force microscope的相關文章
Atomic force microscopy - Wikipedia, the free encyclopedia
瀏覽：1251
日期：2024-07-07
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times ......看更多
網友正在看
熱門 android l 文章
![iOS 8 vs Android L: 多個界面並排看 你喜歡哪個 [圖庫]](https://www.iarticlesnet.com/pub/img/article/29581/1405077661436_xs.jpg)
![“Android L” 用起來就是這樣: 令手機更「好玩」 新功能極方便 [圖庫+影片集]](https://www.iarticlesnet.com/pub/img/article/29264/1404046939105_xs.jpg)
熱門 galaxy s5 文章
