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An On-Chip, AttoFarad Interconnect Charge-Based Capacitance Measurement [CBCM] Technique
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日期：2024-07-11
An On-Chip, Attofarad Interconnect Charge-Based Capacitance Measurement (CBCM) Technique James C. Chen, Bruce W. McGaughy, Dennis Sylvester, and Chenming Hu Dept. of EECS, University of California Berkeley, 211-37 Cory Hall #1772, Berkeley, CA ......看更多
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