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NIST X-ray Photoelectron Spectroscopy (XPS) Database, Version 3.5
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日期:2024-11-11
The NIST XPS Database gives access to energies of many photoelectron and Auger-electron spectral lines. The database contains over 29,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines...看更多