Sheet Resistance and the Calculation of Resistivity or Thickness Relative to Semiconductor Applicati

Sheet Resistance and the Calculation of Resistivity or Thickness Relative to Semiconductor Applicati

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日期:2024-09-05
Four-Point-Probes offers 4 point probe equipment for measuring the sheet resistance and bulk (volume) resistivity of materials used in the semiconductor industry, universities, and in materials science including thin films, wafers, ingots, and other mater...看更多