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GaN HEMT Reliability at the Device Level: A HiREV (High Reliability Electronics Virtual Center) Asse
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日期：2024-09-06
GaN HEMT Reliability at the Device Level: A HiREV (High Reliability Electronics Virtual Center) Assessment June 2012 – NASA NEPP Workshop Eric Heller Physicist Materials and Manufacturing Directorate Air Force Research Laboratory DISTRIBUTION A ......看更多
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