semiconductor material and device characterization的相關文章
semiconductor material and device characterization的相關公司資訊
semiconductor material and device characterization的相關商品
![Characterization of Organic Contaminants Outgassed form Materials Used in Semiconductor Fabs/Process](https://www.iarticlesnet.com/pub/img/site/s_17.jpeg)
Characterization of Organic Contaminants Outgassed form Materials Used in Semiconductor Fabs/Process
瀏覽:1130
日期:2024-08-30
3/25/03 P. Sun/C. Ayre, CA MATTEC, Intel 6 Introduction: Effects of Organic Contamination - Unintentional Doping Due to Outgassing • Unintentional doping on Si device wafers during furnace operation was observed. • Witness wafer test showed that phosphoru...看更多